POSSIBILITIES OF MODERN SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR STUDYING BORON CARBIDES

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

A promising method of scanning transmission electron microscopy is the use of integrated differential phase contrast. Its advantages include high sensitivity to light elements, almost linear relation between the generated image contrast and atomic numbers of Z atoms contained in a sample, noise suppression, and much more. Using the modeling and mathematical processing, prospects of this technique for studying the crystal structure of materials consisting of light atoms have been analyzed by the example of boron carbide polytypes. It is shown that the sensitivity of the technique makes it possible to distinguish columns of boron atoms from columns consisting of carbon. Recommendations on using this technique for analyzing the structures consisting of light elements are formulated.

Авторлар туралы

I. Pavlov

Shubnikov Institute of Crystallography, Federal Scientific and Research Center “Crystallography and Photonics,”Russian Academy of Sciences, Moscow, 119333 Russia

Email: ispav88@gmail.com
Россия, Москва

V. Bondarenko

Shubnikov Institute of Crystallography, Federal Scientific and Research Center “Crystallography and Photonics,”Russian Academy of Sciences, Moscow, 119333 Russia

Email: ispav88@gmail.com
Россия, Москва

A. Vasiliev

National Research Centre “Kurchatov Institute,” Moscow, 123182 Russia; Shubnikov Institute of Crystallography, Federal Scientific and Research Center “Crystallography and Photonics,”Russian Academy of Sciences, Moscow, 119333 Russia; Moscow Institute of Physics and Technology, Moscow oblast, Dolgoprudny, 141701 Russia

Хат алмасуға жауапты Автор.
Email: a.vasiliev56@gmail.com
Россия, Москва; Россия, Москва; Россия, Москва

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