THE STUDY OF GROWTH DEFECTS IN CUBIC SINGLE CRYSTALS OF SYNTHETIC DIAMOND USING X-RAY TOPO-TOMOGRAPHY

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Resumo

The spatial distribution of linear defects in cuboctahedral single crystals of synthetic diamonds, grown under laboratory conditions by the high-pressure high-temperature (HPHT) method near the diamond–graphite equilibrium line, has been studied. Synthetic diamonds of this type have been studied for the first time by the X-ray topo-tomography using a laboratory X-ray source.

Sobre autores

N. Anisimov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia; Moscow State University, Moscow, 119234 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва; Россия, Москва

D. Zolotov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

A. Buzmakov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

I. Dyachkova

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

V. Asadchikov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Autor responsável pela correspondência
Email: asad@crys.ras.ru
Россия, Москва

Bibliografia

  1. Kasu M. // Prog. Cryst. Growth Charact. Mater. 2016. V. 62. P. 317.
  2. D’Haenens-Johansson U.F.S., Butler J.E., Katrusha A.N. // Rev. Mineral. Geochem. 2022. V. 88. P. 689.
  3. Akashi N., Fujimaki N., Shikata S. // Diam. Relat. Mater. 2020. V. 109. P. 108024.
  4. Боуэн Д.К., Таннер Б.К. Высокоразрешающая рентгеновская дифрактометрия и топография / Пер. с англ. Шульпиной И.Л., Аргуновой Т.С. СПб.: Наука, 2002. 256 p.
  5. Black D.R., Long G.G. X-ray topography. Gaithersburg: National Institute of Standards and Technology, 2004. 53 p.
  6. Authier A. Dynamical theory of x-ray diffraction. 2-nd ed. Oxford University Press, 2004. 674 p.
  7. Shikata S., Miyajima K., Akashi N. // Diam. Relat. Mater. 2021. V. 118. P. 108502.
  8. Hornstra J. // J. Phys. Chem. Solids. 1958. V. 5. № 1–2. P. 129.
  9. Ludwig W., Cloetens P., Härtwig J. et al. // J. Appl. Cryst. 2001. V. 34. № 5. P. 602.
  10. Золотов Д.А., Бузмаков А.В., Асадчиков В.Е. и др. // Кристаллография. 2011. Т. 56. № 3. С. 426.
  11. Золотов Д.А., Бузмаков А.В., Елфимов Д.А. и др. // Кристаллография. 2017. Т. 62. № 1. С. 12.
  12. Золотов Д.А., Асадчиков В.Е., Бузмаков А.В. и др. // Письма в ЖЭТФ. 2021. Т. 113. № 3. С. 161.
  13. Lang A.R. // Acta Cryst. 1959. V. 2. P. 249.
  14. Eaton-Magaña S., Shigley J.E., Breeding C.M. // Gems Gemol. 2017. V. 53. P. 262.
  15. Andersen A.H., Kak A.C. // Ultrason. Imag. 1984. V. 6. P. 81.
  16. Palenstijn W.J., Batenburg K.J., Sijbers J. // J. Struct. Biol. 2011. V. 176. P. 250.
  17. Van Aarle W., Palenstijn W.J., De Beenhower J. et al. // Ultramicroscopy. 2015. V. 157. P. 35.
  18. Gonzales R., Woods R. Digital image processing. 4-th ed. Pearson education India, 2009. 1168 p.
  19. Sumiya H., Tamasaku K. // Jpn. J. Appl. Phys. 2012. V. 51. P. 090102.
  20. Sumiya H., Toda N., Satoh S. // SEI Tech. Rev. 2005. V. 60. P. 10.
  21. Moore M., Nailer S., Wierzchowski W. // Crystals. 2016. V. 6. P. 71.

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