Structural defects of superconducting core of the single fiber MgB2/Nb,Cu composite

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Abstract

The microstructure of the MgB2 core of the single fiber composite consisting of MgB2, the Nb barrier, and the Cu shell (MgB2/Nb,Cu), which is synthesized by the powder-in-tube method with an ex situ option and by subsequent annealing, has been studied. It is shown that a dislocation microstructure that exhibits high thermal stability is formed in the MgB2 core during cold deformation, in addition to powder compaction. A high dislocation density is observed inside MgB2 grains. Dislocations form walls with small misorientation angles between subgrains. Annealing at a temperature of 900°C for 1 h leads to a higher density of MgB2 ceramics, and the intergranular contact area increases. Moreover, MgO inclusions with a size of 10 nm or less are formed. Thus, various kinds of structural defects are formed, which can be considered as probable pinning centers for the magnetic flux.

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About the authors

E. I. Kuznetsova

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Author for correspondence.
Email: monocrist@imp.uran.ru
Russian Federation, Ekaterinburg, 620108

T. P. Krinitsina

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Email: monocrist@imp.uran.ru
Russian Federation, Ekaterinburg, 620108

Yu. V. Blinova

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Email: monocrist@imp.uran.ru
Russian Federation, Ekaterinburg, 620108

M. V. Degtyarev

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Email: monocrist@imp.uran.ru
Russian Federation, Ekaterinburg, 620108

P. V. Konovalov

AO VNIINM

Email: monocrist@imp.uran.ru
Russian Federation, Moscow, 123098

K. K. Dikhtiyevskaya

AO VNIINM

Email: monocrist@imp.uran.ru
Russian Federation, Moscow, 123098

I. M. Abdyukhanov

AO VNIINM

Email: monocrist@imp.uran.ru
Russian Federation, Moscow, 123098

A. S. Tsapleva

AO VNIINM

Email: monocrist@imp.uran.ru
Russian Federation, Moscow, 123098

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Supplementary files

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2. Fig. 1. X-ray diffraction patterns of the initial commercial powder (a), MgB2/Nb,Cu tape without heat treatment (b) and after heat treatment (c).

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3. Fig. 2. SEM image of the core structure of MgB2/Nb,Cu tape without heat treatment (a, b) and after heat treatment (c, d).

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4. Fig. 3. TEM image of the core structure of the MgB2/Nb,Cu tape without annealing: a – bright-field image (inset on the left – electron diffraction pattern from grains A (white rectangle) and B (white lines), zone axis [101]MgB2, inset on the right – electron diffraction pattern from grain B, zone axis [101]MgB2; b – dark-field image in reflection (110)MgB2; c – dark-field image of grain A in reflection (110)MgB2; d – dark-field image of grain B in reflection (202)MgB2; d – dark-field image of grain B in reflection (101)MgB2.

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5. Fig. 4. TEM image of the core structure of the MgB2/Nb,Cu tape without annealing: a – bright-field image; b – electron diffraction pattern; c – dark-field image in the (101)MgB2 reflection.

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6. Fig. 5. TEM image of the core structure of the MgB2/Nb,Cu tape without annealing: a – bright-field image; b – electron diffraction pattern; c, d, e – dark-field images in the reflections (110)MgB2, (110)MgB2 and (200)MgO, respectively.

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7. Fig. 6. Structure of MgB2 ceramics (a) and EDS spectra obtained from a particle (b) and from a matrix (c).

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8. Fig. 7. TEM image of the core structure of the MgB2/Nb,Cu tape after annealing: a – bright-field image at lower magnification; b – electron diffraction pattern; c – bright-field image at higher magnification; d – dark-field image in the MgB2(101)/MgO(200) reflection (outlined by a solid line); d – bright-field image of the adjacent region; e – dark-field image in the MgB2(101)/MgO(200) reflection (outlined by a dotted line).

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9. Fig. 8. TEM image of the core structure of the MgB2/Nb,Cu tape after annealing: a – bright-field image; b – dark-field image in the MgB2(101) reflection.

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10. Fig. 9. Volt-temperature characteristic of a wire with a diameter of 1 mm (a). Temperature dependence of the specific resistance of tapes with a thickness of 0.75 mm (b) and tapes with a thickness of 0.48 mm (c).

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