Structure, phase composition and properties of amorphous soft magnetic Fe–Co–Si–B–P tapes

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The analysis of structural and phase states, mechanical and magnetic properties of amorphous FeCoBSi and FeCoBSiP alloys obtained by spinning is performed. The distribution of the elemental composition is traced and the alloy stratification by silicon and boron is noted. It is shown that the experimentally determined values of saturation induction (1.7–1.8 T) and coercive force (18–20 A/m) are practically independent of changes in the composition of the tapes in the studied range of element content. The values of ultimate strength (~162 MPa) and elongation before failure (~0.23%) indicate low plasticity of the studied tapes. However, the value of the elastic modulus was high at 81.5 MPa.

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作者简介

A. Semin

Siberian State Industrial University

编辑信件的主要联系方式.
Email: syomin53@bk.com
俄罗斯联邦, Novokuznetsk

V. Gromov

Siberian State Industrial University

Email: gromov@physics.sibsiu.ru
俄罗斯联邦, Novokuznetsk

Yu. Ivanov

Institute of High-Current Electronics, Siberian Branch of the Russian Academy of Sciences

Email: yufi55@mail.ru
俄罗斯联邦, Tomsk

S. Panin

Institute of Strength Physics and Materials Science

Email: paninsergey71@mail.ru
俄罗斯联邦, Tomsk

P. Mogilnikov

Central Research Institute of Ferrous Metallurgy named after I.P. Bardin

Email: pavel_mog@mail.ru
俄罗斯联邦, Moscow

I. Litovchenko

Institute of Strength Physics and Materials Science

Email: litovchenko@spti.tsu.ru
俄罗斯联邦, Tomsk

I. Selivanov

Siberian State Industrial University

Email: ilyselivanov@mail.ru
俄罗斯联邦, Novokuznetsk

参考

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2. Fig. 1. DSC thermograms of samples (FeCo)82B13Si5 (a) and (FeCo)82B12Si4P2 (b).

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3. Fig. 2. Electron microscopic image of the structure of the tape subjected to etching: a, b – alloy (FeCo)82B13Si5; c, d – alloy (FeCo)82B12Si4P2.

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4. Fig. 3. Electron diffraction patterns of (FeCo)82B13Si5 (a) and (FeCo)82B12Si4P2 (b) alloy tapes.

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5. Fig. 4. Electron microscopic image of the structure of the tape subjected to electrolytic thinning (a, b) and thinning by a flow of argon ions (c, d): a, c – bright fields; b, d – corresponding microelectron diffraction patterns.

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